Mitutoyo - Полный каталог инструмента - 2014 Английский язык
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MF-U Microscope
SERIES 176 – High-Power Multi-Function Measuring Microscopes
• Observation with a clear and flare-free erect • Illumination unit (reflected/transmitted) selectable Technical Data
image and a wide field of view. from a high-intensity LED or halogen bulb
• Measuring accuracy that is the highest in its class (required). Observation image: Erect image
(and conforms to JIS B 7153). • Variable aperture diaphragm (reflected/ Optical tube: Siedentoph type (pupil distance
• Proven high-NA objectives from the FS optical transmitted) allows observation measurement adjustment: 51-76 mm), 1X tube lens,
system (long working distance type). while suppressing light diffraction. Binocular tube (depression: 30),
• Integration of metallurgical and measurement • Variety of standardized stages in sizes to suit Reticle projection method, with TV
microscope functions provides high-resolution practically any application. mount, Optical path ratio (eyepiece/TV
observation and a high-accuracy measurement • Quick-release mechanism useful for moving the mount: 50/50)
solution. stage quickly when measuring workpieces that Eyepiece lens: 10X (field No.: 24 mm),
are large in size or quantity. Optional: 15X, 20X
• High-magnification eyepiece observation up to Turret (optional): Manual or power
4000X. Objective (optional): M/BD Plan Apo objective from 1X to
• Low-noise design. 100X
Transmitted illumination
Light source: Halogen bulb (12V, 50W)
Optical system: Telecentric illumination with adjustable
aperture diaphragms
Functions: Light intensity adjustable, Non-stepped
brightness adjustment
Surface illumination
Light source: Optional halogen illumination unit
(fibre-optic cold light illumination)
Optical system: Koehler illumination with adjustable
aperture diaphragms
Functions: Light intensity adjustable, Non-stepped
brightness adjustment
Display unit
No. of axes: 2 or 3
Resolution: 0.001 mm / 0.0005 mm / 0.0001 mm /
.0001" / .00005" / .00001"
Functions: Zero-setting, Direction switching, Data
output (via RS-232C interface)
Power supply: 100/110/120/220/240V AC, 50/60 Hz
Mass: 65.5 kg (1010C) / 69.5 kg (2010C) /
130 kg (2017C) / 138 kg (3017C) /
144 kg (4020C)
Optional Accessories
MF-UB3017C 378-856-5: 10X eyepiece set (view field dia.: 24 mm)
XY stage travel range: 300 x 170 mm 282.00
(with optional turret, objective and fibre-optic
illumination) 378-857-5: 15X eyepiece set (view field dia.: 16 mm)
313.00
J 378-858-5: 20X eyepiece set (view field dia.: 12 mm)
326.00
378-018: Adjustable manual BF turret
822.00
378-116: Adjustable power BF turret
POA
176-211: Adjustable manual BF/DF turret
534.00
378-210: Adjustable power BF/DF turret
POA
––––––: Reticles (See page J-21.)
Polarized light observation Differential interference contrast (DIC) observation 178-092: Polarization unit
Used for observing materials with special optical characteristics, Effective in detecting fine scratches and steps on the surface of POA
such as minerals and liquid crystals. metals, liquid crystals and semiconductors. 378-076: DIC unit for 100X, SL80X, SL50X objective
1590.00
378-078: DIC unit for 50X, SL20X objective
1590.00
378-079: DIC unit for 20X objective
1590.00
378-080: DIC unit for 10X, 5X objective
1590.00
12AAA643: ND2 filter
56.90
12AAA644: ND8 filter
30.00
Dark Field (DF) observation Bright Field (BF) observation 12AAA645: GIF filter
Scratches and dust that cannot be viewed in bright field Directly views the light scattered from the surface of the 60.40
observation can be observed by this method and in high workpiece. This is the commonest method of observation. 12AAA646: LB80 light-balancing filter
contrast. 30.00
J-13 Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benefit of the latest technological advances.
Therefore the company reserves the right to change any or all aspects of any product specification without notice.
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