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Technical Data SERIES 178 – Surface Roughness Tester with PC
X1 axis (drive unit) • High-precision/performance surface roughness tester that runs under the FORMTRACEPAK sophisticated
Resolution: 0.05 m analysis software package.
Scale: Linear encoder • A built-in joystick in the control unit allows quick and easy positioning. The manual knob allows fine
Drive speed: 0 - 40 mm/s positioning of a small stylus for measuring small holes.
Measuring speed: 0.02 - 5 mm/s • Simple setup for surface roughness measuring conditions.
Traverse direction: Backward • A simple input function is used to calculate according to ISO/JIS roughness standard drawing instruction
Traverse straightness: 0.15 m/100 mm symbols. Complicated setups can easily be entered by selecting a drawing instruction symbol from the
Z2 axis (column) surface roughness menu.
Type: Manual operation
Detector
Range / resolution: 800 m/0.01 m, 80 m/0.001 m,
8 m/0.0001 m
Measurement
method: Skidless/skidded
Type: Differential inductance
Drive unit control: PC
Surftest SV-2100M4 (PC type)
Evaluation Capability: FORMTRACEPAK
Assessed profiles: P (primary profile), R (roughness
profile), WC, WCA, WE, WEA,
DIN4776 profile, envelope residual
profile, roughness motif, waviness
motif
Evaluation parameters: Ra, Rq, Rz, Ry, Rz(JIS), Ry(DIN), Rc, Rp,
Rpmax, Rpi, Rv, Rvmax, Rvi, Rt, Rti,
R3z, R3zi, R3y, S, Pc (Ppi), Sm, HSC, mr,
dc, plateau ratio, mrd, Rk, Rpk, Rvk,
Mr1, Mr2, Da, Dq, la, lq, Sk, Ku, Lo,
Lr, A1, A2
Roughness motif
parameters: Rx, R, AR, SR, SAR, NR, NCRX, CPM
Waviness motif
parameters: Wte, Wx, W, AW, SW, SAW, NW
Analysis graphs: ADC, BAC1, BAC2, power spectrum
chart, autocorrelation chart, Walsh
power spectrum chart, Walsh
auto-correlation chart, slope
distribution chart, local peak
distribution chart, parameter
distribution chart
Digital filter: 2CR-75%, 2CR-50%, 2CR-75% (phase
corrected), 2CR-50% (phase corrected),
Gaussian-50%
Cutoff length*: lc: 0.025 mm, 0.08 mm, 0.25 mm,
0.8 mm, 2.5 mm, 8 mm, 25 mm
fl: 0.08 mm, 0.25 mm, 0.8 mm, SPECIFICATIONS
2.5 mm, 8 mm, 25 mm
fh: 0.08 mm, 0.25 mm, 0.8 mm, Model SV-2100M4 (PC type) L
Code No. (mm)
2.5 mm, 8 mm Code No. (inch/mm) 178-634-01E 178-634-02E
Sampling length*: 0.025 mm, 0.08 mm, 0.25 mm, 178-635-01E 178-635-02E
0.8 mm, 2.5 mm, 8 mm, 25 mm Measuring range 100 mm
Data compensation
functions: Tilt compensation, R-plane (curved Stylus tip Angle 60 90
Radius
surface) compensation, ellipse 2 µm 5 µm
compensation, parabola compensation, Detector measuring force 0.75 mN 4 mN
Vertical travel
hyperbola compensation, quadric Granite base size (WxD) 350 mm manual column
curve automatic compensation, Dimensions (main unit, WxDxH)
polynomial compensation, polynomial Mass 600 x 450 mm
automatic compensation 716 x 450 x 863 mm
*An arbitrary length can also be specified in the range from 0.025 mm 144 kg (main unit 140 kg; PC I/F unit 3.8 kg)
*to the maximum traverse length.
Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benefit of the latest technological advances. L-14
Therefore the company reserves the right to change any or all aspects of any product specification without notice.
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