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Formtracer SV-C3200/SV-C4500
SERIES 525 – Surface Roughness/Contour Measuring System
• A highly accurate measuring system that allows measurement of surface roughness and contour with Technical Data
just one instrument.
• Dramatically increased drive speed (X1 axis: 80 mm/s, Z2 axis column: 30 mm/s) further reduces total X1 axis (drive unit)
measurement time. Resolution: 0.05 m
• Mitutoyo has adopted highly rigid ceramic guides, combining small secular change and remarkable Scale: Reflective-type linear encoder
resistance to abrasion, to maintain the outstanding traverse straightness specification for an extended Drive speed: 0 - 80 mm/s and manual
period of time. Measuring speed: 0.02 - 5 mm/s
• The drive unit (X1 axis) and column (Z2 axis) are equipped with highly accurate linear encoders (ABS Measuring direction: Forward/backward
type on the Z2 axis). This improves reproducibility of continuous automatic measurement of small holes Note: As for SV-C4500, set the measurement
in the vertical direction and repeated measurement of parts which are difficult to position.
• Measurement accuracy specifications for the drive unit and column are exceptional, as is that for the force with Formtracepak
drive unit traverse straightness – all excellent characteristics for handling workpieces calling for high Accuracy (at 20°C): ±(0.8+L/100) m (SV-C3200S4/H4/W4;
accuracy. SV-C4500S4/H4/W4),
±(0.8+2L/100) m (SV-C3200S8/H8/
Formtracer SV-C3200S4 W8; SV-C4500S8/H8/W8)
L = drive length (mm)
Inclination range: ±45° (with X1 axis inclination unit)
Traverse straightness: (0.05+0.1L/100) m (S4, H4, W4
types), 0.5 m / 200 mm (S8, H8, W8
types)
Note: with the X1 axis in the horizontal
orientation
Z1 axis (contour detector)
Measuring range: ±30 mm
Resolution: 0.04 m (SV-C3200),
0.02 m (SV-C4500)
Scale: Rotary arc encoder
Accuracy (at 20°C): ±(1.6+|2H|/100) m (SV-C3200)
±(0.8+|2H|/100) m (SV-C4500)
Note: H = measurement height from the
horizontal position (mm)
Stylus up/down
operation: Arc movement
Face of stylus: Upward/downward (SV-C3200),
Upward/downward, direction switch by
Formtracepak (SV-C4500)
Measuring force: 30 mN (SV-C3200)
10, 20, 30, 40, 50 mN (SV-C4500)
Note: As for SV-C4500, set the measurement
force with Formtracepak
Traceable angle: Ascent: 77°, descent: 83° (using
the standard stylus provided and
depending on the surface roughness)
Stylus tip: Carbide, R25 m
Z1 axis (surface finish detector)
Range / resolution: 800 m / 0.01 m, 80 m / 0.001 m,
8 m / 0.0001 m (up to 2400 m
with an optional stylus)
Stylus tip: Diamond, 90 / R5 m (60 / R2 m:
low force type)
Type: Differential inductance
Surface Roughness Detector Contour Detector Z2 axis (column)
Resolution: 1 m
Scale: ABSOLUTE linear encoder
Drive speed: 0 - 30 mm/s ad manual
Mass
Controller unit: 14 kg
Remote control box: 0.9 kg
L Power supply: 100 - 120, 200 - 240V AC, 50/60Hz
• Compliant with JIS '82/'94/'01, ISO, ANSI, DIN, • The contour detector of the SV-C4500 series
Power consumption: 400 W (main unit only)
VDA, and other international surface roughness instruments can continuously measure in the
standards. upward and downward directions without the
• The standard surface roughness detector supplied need to change the arm orientation or reposition
is the high-accuracy model (0.75 mN/4 mN the workpiece, when combined with the double
measuring force) that provides a resolution down cone-end stylus (a new product with contact
to 0.0001 m. points in the upward and downward directions).
L-19 Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benefit of the latest technological advances.
Therefore the company reserves the right to change any or all aspects of any product specification without notice.
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