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          Testing Parallelism of Micrometer Measuring                               General Notes on using the Micrometer
            Faces
                                                                                    1. Carefully check the type, measuring range, accuracy, and other
                  Optical parallel reading direction on the spindle side              specifications to select the appropriate model for your application.

B                                                                                   2. Leave the micrometer and workpiece at room temperature long enough for
                                                                                      their temperatures to equalize before making a measurement.

                                                                                    3. Look directly at the index line when taking a reading against the thimble
                                                                                      graduations.

                                                                                    	 If the graduation lines are viewed from an angle, the correct alignment
                                                                                      position of the lines cannot be read due to parallax error.

           Optical parallel                                                                       (b)
                             Fringes on the spindle side                            (a)

Parallelism can be estimated using an optical parallel held between the faces.                            (c)
Firstly, wring the parallel to the anvil measuring face. Then close the spindle
on the parallel using normal measuring force and count the number of red                                       Thimble
interference fringes seen on the measuring face of the spindle in white light.
Each fringe represents a half wavelength difference in height (0.32 m for red                        Sleeve            (a) From above the index line
fringes).
In the above figure a parallelism of approximately 1 µm is obtained from
0.32 µm x 3=0.96 µm.

 Testing Flatness of Micrometer Measuring Faces                                                                        (b) Looking directly at the index line

Flatness can be estimated using an optical flat (or parallel) held against a face.
Count the number of red interference fringes seen on the measuring face in
white light. Each fringe represents a half wavelength difference in height
(0.32 m for red).

                         Interference fringe                                                                                               (c) From below the index line
                         reading direction
                                                                                            4. Wipe off the measuring faces of both the anvil and spindle with
                Optical flat                                                                  lint-free paper set the start (zero) point before measuring.
                   Anvil
                                                                   Optical flat
Measuring face is curved by approximately                            Anvil
1.3 m. (0.32 m x 4 paired red fringes.)
                                              Measuring face is concave (or convex) approximately
                                                0.6 m deep. (0.32 m x 2 continuous fringes)

                                              B-79

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