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Image Correlation and the MICSYS Two-Dimensional Encoder
Principle of measurement
When a rough-surfaced object is irradiated with a laser beam, reflected coherent light scattering from the surface creates visible
interference in the form of a speckle pattern. As the object moves in the XY plane, the speckle pattern also moves in response.
Displacement of the object can be calculated by comparing, through image correlation, the speckle images obtained before and
after movement, and this is the principle used in the highly accurate MICSYS measuring system.
Applications Measure displacement caused by
1. Evaluation of stages used in manufacturing equipment and inspection systems temperature, humidity, voltage
fluctuation or other factors
Actuator
a) Evaluation of positional repeatability b) Evaluation of standstill stability and drift H
2. Highly accurate positioning of workpieces Setting and removal
Actuator
3. Measurement of minute displacement Measure displacement caused by
Load temperature or humidity fluctuations or
other factors and displacement caused during
Structure (beam) a material attachment process, etc.
a) Measurement of minute displacement of a structure b) Measurement of minute displacement of a workpiece
H-16
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